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Biographie et livres de Cher Ming Tan

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Professor Cher Ming Tan obtained his PhD in Electrical Engineering from the University of Toronto in 1992. He has eight years of working experience in reliability in the electronics industry (both Singapore and Taiwan) before joining Nanyang Technological University (NTU) as a faculty member in 1996 where he stayed until 2014. He is now a Professor at Chang Gung University, Taiwan, and the Director of the Centre of Reliability Science and Technology (CReST). He has published more than 400
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Téléchargez le livre : Theory and Practice of Quality and Reliability Engineering in Asia Industry
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Theory and Practice of Quality and Reliability Engineering in Asia Industry

Thong Ngee Goh , Cher Ming Tan

Springer

2017-01-20

PDF, ePub

This book discusses the application of quality and reliability engineering in Asian industries, and offers information for multinational companies (MNC) looking to transfer some of their operation and manufacturing capabilities to Asia and at the...

239,99 €

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Ebooks de Cher Ming Tan en PDF et EPUB

2 Livre(s)
Télécharger le livre : Electromigration Modeling at Circuit Layout Level
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Electromigration Modeling at Circuit Layout Level
Feifei He , Cher Ming Tan
Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels....

Editeur : Springer
Parution : 2013-03-16
Collection : SpringerBriefs in Applied Sciences and Technology
ePub

59,99 €
Télécharger le livre : Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
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Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Zhenghao Gan , Yuejin Hou , Wei Li , Cher Ming Tan
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections provides a detailed description of the application of finite element methods (FEMs) to the study of ULSI interconnect reliability. Over the past two decades the application of FEMs...

Editeur : Springer
Parution : 2011-03-28
Collection : Springer Series in Reliability Engineering
ePub

107,99 €